Equipment Lineup
Test

Probing Machine and Testsystem::A-PM-60B/EM-11A
ID | T000661 |
---|---|
Manufacturer | TOKYO SEIMITSU |
Model | A-PM-60B/EM-11A |
Vintage | --- |
NO IMAGE
Probing Machine:19S
ID | T000654 |
---|---|
Manufacturer | TEL |
Model | 19S |
Vintage | --- |

IC Tester:J750
ID | T000653 |
---|---|
Manufacturer | TERADYNE |
Model | J750 |
Vintage | --- |

Temperature Testing System:TP04310A-3C44-4
ID | T000646 |
---|---|
Manufacturer | Temptronic |
Model | TP04310A-3C44-4 |
Vintage | --- |

Tester:T6577
ID | T000640 |
---|---|
Manufacturer | ADVANTEST |
Model | T6577 |
Vintage | --- |

Tester:Micro Flex
ID | T000639 |
---|---|
Manufacturer | TERADYNE |
Model | Micro Flex |
Vintage | --- |

Tester:T5335
ID | T000638 |
---|---|
Manufacturer | ADVANTEST |
Model | T5335 |
Vintage | --- |

Tester:ASL1000
ID | T000628 |
---|---|
Manufacturer | LTX-Credence |
Model | ASL1000 |
Vintage | 2010 |

Illuminator for inspection of CCD:IA-OPT228WS
ID | T000626 |
---|---|
Manufacturer | Inter Action |
Model | IA-OPT228WS |
Vintage | 2004 |

Tester:A563HS
ID | T000613 |
---|---|
Manufacturer | Teradyne |
Model | A563HS |
Vintage | --- |

Probe station : M150
ID | T000602 |
---|---|
Manufacturer | Cascade Microtech |
Model | M150 |
Vintage | --- |

Prober: UF60
ID | T000585 |
---|---|
Manufacturer | TOKYO SEIMITSU |
Model | UF60 |
Vintage | --- |

Prober: UF60
ID | T000576 |
---|---|
Manufacturer | TOKYO SEIMITSU |
Model | UF60 |
Vintage | --- |

Tester : T3326A
ID | T000539 |
---|---|
Manufacturer | ADVANTEST |
Model | T3326A |
Vintage | --- |

Prober: UF60
ID | T000488 |
---|---|
Manufacturer | TOKYO SEIMITSU |
Model | UF60 |
Vintage | --- |

Prober: UF60
ID | T000487 |
---|---|
Manufacturer | TOKYO SEIMITSU |
Model | UF60 |
Vintage | --- |

Prober: UF60
ID | T000486 |
---|---|
Manufacturer | TOKYO SEIMITSU |
Model | UF60 |
Vintage | --- |
SOLD OUT

LED Measuring System
ID | T000633 |
---|---|
Manufacturer | --- |
Model | --- |
Vintage | --- |